Geological Survey of Estonia,
Kreutzwaldi tn 5,
Rakvere,
44314,
Estonia
20th May 2021
Dear Johannes,
Further to recent email correspondence between Geotek and the Geological survey of
Estonia, I have great pleasure in providing this technical specification document to you
regarding the Geotek MSCL-XYZ-XRF system.
We hope that you find the following information useful, and should you require any further
information on what is included in this document or on non-destructive core logging then
please do not hesitate to contact the undersigned.
Yours sincerely,
James Shreeve
Sales and Marketing Director
Geotek Limited.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
GEOTEK MSCL-XYZ-XRF
TABLE OF CONTENTS
Geotek MSCL-XYZ-XRF ....................................................................................................... 2
1 DOCUMENT OVERVIEW .............................................................................................. 3
2 INTRODUCTION TO GEOTEK........................................................................................ 3
3 MSCL-XYZ-XRF INTRODUCTION ................................................................................... 3
3.1 FACILITY REQUIREMENTS ........................................................................................ 4
3.2 CABINET BASED SySTEM ......................................................................................... 4
3.3 MOTOR CONTROL ................................................................................................... 5
3.4 CORE HANDLING ..................................................................................................... 5
3.5 WHOLE AND/OR SPLIT CORE ................................................................................... 6
3.6 DATA ACQUISITION ................................................................................................. 7
3.7 JUSTIFICATION OF USE – KEY ADVANTAGES OF THE MSCL-XYZ-XRF.......................... 7
4 SPECIFICATIONS ......................................................................................................... 7
4.1 SUMMARY OF SYSTEM FEATURES ........................................................................... 7
4.2 SENSOR OPTIONS AVAILABLE ................................................................................ 10
HIGH-RESOLUTION GEOSCAN VI LINESCAN CAMERA .......................................... 11
ASD LABSPEC CIS, VNIR/SWIR SPECTROMETER ................................................... 14
POINT MAGNETIC SUSCEPTIBILITY ..................................................................... 15
KONIKA MINOLTA COLOUR SPECTROPHOTOMETER ........................................... 16
5 GEOTEK XRF SENSOR TECHNOLOGY - MECHANICS AND SPECIFICATIONS ................... 17
5.1 DEMONSTRATION OF GEOTEK XRF PERFORMANCE ............................................... 19
5.2 XRF RESULTS FROM THE TUFF SAMPLE .................................................................. 19
5.3 LOW ATOMIC NUMBER (Z) SENSITIVITY ................................................................... 3
5.4 REPEATABILITY OF MEASUREMENTS ON A GEOTEK XRF SENSOR ............................. 5
5.5 CALIBRATED GEOTEK XRF DATA VS. LABORATORY XRF DATA................................... 6
GEOTEK XRF SENSOR CONCLUSIONS .................................................................... 6
5.6 GEOTEK SOFTWARE PRODUCTS ............................................................................... 7
GEOTEK ACQUISITION SOFTWARE........................................................................ 7
BAXIL SOFTWARE .............................................................................................. 11
6 GEOTEK SUPPORT AND WARRANTY.......................................................................... 13
6.1 ANNUAL GOLD SERVICE CONTRACT ....................................................................... 14
6.2 ANNUAL SILVER SERVICE CONTRACT ..................................................................... 14
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
7 MSCL-XYZ-XRF CUSTOMER REFERENCES ................................................................... 14
1 DOCUMENT OVERVIEW
It is understood that the Geological Survey of Estonia ‘EESTI Geoloogiateenistus’ is
considering the purchase of a Geotek MSCL-XYZ-XRF core scanning system. The purpose
of purchasing such equipment is to acquire invaluable, real-time data from core material
investigating geochemical and visual datasets. This document aims to provide technical details
regarding the Geotek MSCL-XYZ-XRF.
2 INTRODUCTION TO GEOTEK
The study of core samples through Geotek’s Multi Sensor Core Logging platforms (MSCL) has
long been recognized (e.g. Schultheiss and Weaver, 1992 or Rothwell, 2006) as a crucial
method for deriving a geological stratigraphy, and investigating geophysical and geochemical
soil and rock properties. MSCL systems employ a range of non-destructive petrophysical and
spectroscopic/geochemical sensors to create a digital high (sub-mm to deci-cm) resolution
record of the sub-surface stratigraphy.
Founded in 1994, Geotek have grown globally from initially supplying a range of Multi-Sensor
Core Logger (MSCL) and X-ray CT systems (XCT), to developing and providing specialist
equipment and consultancy services to the research/academic markets, the Oil & Gas
industry, the geotechnical markets and the mining & mineral exploration industries.
The Geotek MSCL systems enable a suite of geophysical and/or geochemical measurements
to be obtained rapidly, accurately and automatically for sediment or rock cores. The rugged
nature of the equipment makes it suitable for use in either an onshore laboratory/repository
environment or onboard survey and drilling vessels.
All of Geotek’s core loggers accept core between 50 mm and 150 mm in diameter and up to
1.55 m in length. Geological cores and materials come in a variety of sizes therefore the MSCL
systems are designed for a full range of core material in a variety of liner compositions. To
accommodate varying customers’ requirements (both operational and scientific), we provide
a range of different core loggers including the MSCL-XYZ-XRF for multi-core scanning.
3 MSCL-XYZ-XRF INTRODUCTION
Every core, in any science or engineering field, benefits from non-destructive, geological
analysis. Measured values may be used intrinsically for their actual values (eg. elemental
data), or as proxies for changes in lithology or depositional environment (eg. magnetic
susceptibility or colour variations).
The MSCL-XYZ Core Workstation is a popular and well established product within the Geotek
customer base, particularly for those interested in scanning core in boxes or who wish to
analyse multiple core samples in one core loading process. It is the ideal system for high-
resolution lab based studies. System details can be found in Table 1.
Geotek offer detailed, high-resolution XRF analysis of rock core or sediment sample surfaces
to provide a quantitative assessment of elemental composition of the sample through our
Geotek XRF sensor. Due to the automated, high-resolution nature of the MSCL, the XRF
datasets can be collected with a repeatable geometry on the core surface and within a time
efficient manner with minimum user inputs. An automated process such as this allows users
to focus on interpretative tasks rather than data collection. High-resolution XRF logging means
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
that elemental composition can be used to more accurately correlate separate beds between
core locations, sediment source areas, or improve the understanding of core composition.
An MSCL-XYZ-XRF is the ideal platform to acquire XRF data as it offers a stable and
repeatable geometry with each measurement depth co-registered with other spectroscopy or
petrophysical sensor measurements. The MSCL-XYZ-XRF sensors move along the core
samples (X-axis) moving up and down simultaneously to carefully make contact with the core
surface (Z-axis) and acquire measurements. The system is compatible with various
spectroscopic parameters and high-resolution visible and UV linescan imaging. The MSCL-
XYZ XRF system therefore provides a compact solution for XRF and other non-destructive
measurements from split or whole unlined core (Figure 1).
Table 1.,System details for MSCL-XYZ-XRF
INSTRUMENT DIMENSIONS (L X W X WEIGHT [KG] POWER
H) [MM]
MSCL-XYZ-XRF 3090 x 1421 x 2180 1200 kg (packed weight 110v to 220 v, single phase.
with all accessories Power draw is up to 1.5W
Machine weight ~ 800kg) 13A supply
3.1 FACILITY REQUIREMENTS
The XYZ will run on single phase, 110v to 220v electrical connections and does not require
any additional cooling or additional facilities to be installed. It is recommended that the system
is operated using an Uninterruptable Power Supply (UPS) which should be purchased by the
customer, if taken offshore or to remote locations.
For the high-resolution helium flush XRF sensor, a Helium: 5-10 ml/ min is required.
3.2 CABINET BASED SYSTEM
The MSCL-XYZ-XRF is specifically designed to acquire geochemical data from multiple core
samples in one scanning period.
In its normal configuration, it is cabinet based including a dual-interlock system to prevent
accidental exposure of users and passers-by (Figure 1). Furthermore, the cabinet allows the
users to move around the system in close proximity and allows the system to be installed into
a normal laboratory.
The cabinet complies with USA and EU regulations and requirements on closed X-ray cabinet
systems. The cabinet surface dose rate is designed to be less than 2.5 µsvh-1. It is fitted with
emergency stop buttons on the outside of the cabinet, as well as illumination beacon to warn
operators/passers-by of when the X-ray source is energised. Additional warnings are
displayed within the software.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Figure 1., Geotek MSCL-XYZ-XRF for scanning split core samples. Sensor options include: XRF,
Magnetic susceptibility, colour spectrometry and high-resolution linescan imaging.
3.3 MOTOR CONTROL
The MSCL-XYZ benefits from 3 precision ball screws controlled by stepper motors allowing
for precision of movement of less than 0.1 mm. As a result, of this precision Geotek have
excellent repeatability of measurement position, and can depth co-register each of the sensor
measurements with one another. The Z-arm controls the vertical movement and allows the
sensors to touch lightly onto the core surface. In order to prevent damage to soft
unconsolidated sediments each sensor has a spring tensioner to remove the weight of the
sensor from the surface of the core and hence prevent damage.
3.4 CORE HANDLING
The MSCL-XYZ benefits from a horizontal core loading. Each core section is placed onto a
retractable core bed by the user (Figure 2). The cores may be placed onto a set of rails which
hold single core sections of up to 1.55m in length or into a bespoke core boxes/holders prior
to scanning (Figure 1). The user pushes the core bed into the cabinet and closes the front
shielding door. At this point, the scanning may be set-up using the MSCL-XYZ software and
scanning may commence (Figure 3).
The MSCL-XYZ can hold a maximum of either:
• Seven (7) x 1.55 m long sediment or rock cores
• Two (2) x 3ft core boxes
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Figure 2., MSCL-XYZ-XRF user placing core samples onto the core bed prior to scanning.
Figure 3., Geotek MSCL-XYZ-XRF sensors translating over multiple core samples to acquire
geochemical datasets simultaneously
3.5 WHOLE AND/OR SPLIT CORE
The MSCL-XYZ-XRF accepts nearly any form of core material. Depending on the mechanical
configuration of the sensors, data may be obtained from either whole core sections or from
split core sections contained in plastic liners.
Generally, individual core sections between 50-150 mm in diameter and up to 1.55m in length
can be logged at spatial intervals as low as a few millimetres. The data acquisition
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
configuration (which sensors are active and at what spatial intervals they collect data) can be
fully defined by the user and changed between core sections as desired.
Should the project require the cores to be split, Geotek has developed a core splitter to
uniformly cut sediment cores acquired in plastic liners longitudinally creating a flat and
reproducible core surface upon which future measurements can be acquired. Immediately
following core-splitting, Geotek can provide high-resolution core photography in visible or
ultraviolet fluorescence using the GeoScan VI Linescan Imaging camera integrated on the
MSCL-XYZ-XRF. The resulting linescans provide an invaluable record of the fresh core
surface before any sub-sampling or oxidation can take effect.
3.6 DATA ACQUISITION
Acquisition of MSCL parameters from the core surface is conducted through Geotek
developed, Geoscientist-friendly software. The software uniquely allows the user to choose
measurement resolution (sub-mm to deci-cm scale), or select specific measurement points for
each core section. In addition, calibration of the sensors and integration times for each
measurement is controlled through the Geotek software.
During acquisition, the high-resolution core imaging will typically be conducted first using UV
or visible light. Once completed, the MSCL point sensors will acquire data simultaneously at
the desired logging resolution. The data for each sensor are displayed live during logging and
the user can conduct basic visualisation of the MSCL data.
The acquisition speed of the instrument can vary depending on the sensor arrangements
selected, count times for each sensor and the desired logging resolution, the finer the
resolution the longer the scan time. However, typically logging speeds can range between 10
and 60 minutes per metre.
3.7 JUSTIFICATION OF USE – KEY ADVANTAGES OF THE MSCL-XYZ-XRF
The MSCL-XYZ model has the ability to load multiple cores or specific core boxes at once and
as a result is particularly valuable in a repository environment or where large core throughput
is required without user intervention. It is common for core repositories or laboratories to utilise
handheld instruments such as XRFs, VNIR/SWIR spectrometer’s and DSLR cameras.
However, typically these measurements are acquired by hand with one operator in charge of
each measurement. As a result, handheld measurements are usually at low resolution
intervals downcore and are time consuming to acquire.
The MSCL-XYZ XRF can integrate multiple sensors onto a single platform and the
automatically acquire these multiple datasets at co-registered depths downcore. A Core
Workstation can therefore free up staff from laborious manual measurements allowing them
to focus on data analysis, and increase productivity through a core repository, institution, or
industrial laboratory.
4 SPECIFICATIONS
4.1 SUMMARY OF SYSTEM FEATURES
The MSCL-XYZ-XRF is predominantly designed around the acquisition of XRF datasets using
the ultra-sensitive Geotek XRF sensor head. This sensor is installed within a shielded cabinet
with dual-interlocked doors. Further detailed information on the Geotek XRF sensor is provided
in Table 2).
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Table 2., MSCL-XYZ-XRF specifications with particular reference to the Geotek XRF sensor.
EQUIPMENT SPECIFICATION
System type Multi-core workstation with retractable core bed and rails
sets/bespoke core boxes with cabinet lining
Core types Ideally split cores up to 1.55 m in length and up to 150mm in
diameter. Possible to take measurements from whole core also,
but point sensor technology works better with a flat surface.
Accepts whole, 2/3 cut, square cut, and 1.2 cut cores
Core Loading Horizontal core mounting and scanning position
Sensor motion Fully automated motion in the horizontal and vertical axes.
Linear precision: 0.01 mm. All point sensors are moved in
unison and collect data in parallel. Contact sensors have
adjustable counterbalancing to prevent damage to core surface.
Automated and software controlled sensor acquisition with
contact sensor measurements acquired simultaneously for
efficient data acquisition.
Tab-delimited ASCII files containing all measured parameters
Data Output vs. depth in section and core: elemental concentrations,
spectral reflectance data by wavelength band, magnetic
susceptibility.
25, 50, or 100 µm per pixel with outputs of 16-bit RGB TIFF
Linescan image outputs images.
Data acquisition rates highly dependent on the user setup and
Core Processing Speed sampling interval. A typical scan for only XRF would include a
calibrated set-up for 22 elements (acquired from calibration).
Example: Using a 5 second count time per beam, at a 1 cm
logging interval, allows the user to scan 1 m every 40 minutes.
Geotek XRF X-ray Up to 50 kV and 15 W, Rh anode allowing sulfur detection, air-
source cooled, 50 μm Be window. (>25,000 active hours, or 50,000
installation hours)
2
Geotek XRF X-ray RaySpec SiriusSD Silicon Drift Detector, 30 mm x 0.45 μm,
detector FWHM: down to 129 eV at Mn Kα, (8 μm) Be window.
Geotek XRF Spectral The Geotek XRF head can operate in two distinct ways –
analysis calibrated and uncalibrated:
The calibrated mode uses a tuned fundamental parameters
technique to convert elemental peaks in the collected spectra
to semi-quantitative concentrations in parts-per-million (ppm)
for the possible 22 elements.
The uncalibrated mode simply collects the raw XRF spectra
for given beam conditions that the user can specify depending
on which elements they are interested in – certain beam
conditions are optimised (excitation and filtering) for certain
ranges of elements. Using bAxil software the spectra can be
analysed to determine the intensity (counts or counts/s) of
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
individual element peaks (many more than the possible 22
elements in the calibrated mode). This is a technique
commonly used in academia for looking at changes in the rock
and sediment chemistry, specifically using elemental ratios (eg
Fe/Ti, Sr/Ca).
Elements detected in the Na to U
Geotek XRF
Geotek XRF Downcore 10, 1 or, 0.1 mm using motorised slits
resolution
Geotek XRF Cross-core 5, 10, or 15 mm using manual collimators
resolution
Core accepted Diameter: 55-150 mm; Length: up to 155 cm
Radiation shielding and 3 mm of steel on all sides with dual interlocks on doors
safety
Electronics and PC Integrated electronics and computer system. Supplied with a
Windows 10 PC.
Electronics rack 55 cm x 60 cm x 60 cm (L x W x H)
Compatible Sensor Geotek high-sensitivity XRF
technology
High-resolution Geoscan VI linescan camera (with option of
UV imaging also)
Point magnetic susceptibility
VNIR/SWIR spectrometry using ASD Labspec
Colour spectrophotometry (Using either ASD VNIR/SWIR or
Konica Minolta)
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
4.2 SENSOR OPTIONS AVAILABLE
The Geotek MSCL-XYZ-XRF system offers a unique opportunity to invest in a state-of-the-art
core characterisation platform that deliver geochemical data from various sensor technologies.
Geological core material is precious and often irreplaceable and in order to maximise data
recovery from every cm a laboratory must turn to non-destructive sensor technology such as
those described in Table 3).
Table 3., Summary of Available Geotek Sensor Technology
GEOTEK SENSOR PERFORMANCE DATA OUTPUT ADVANTAGE
TECHNOLOGY STATISTICS
• 100, 200, 400, and • 16-bit TIFF • Low, medium and high
500 ppcm over 4” core • XML Metadata resolution settings
filesRGB Colour
Geoscan VI Visible width without camera change
Profile as ASCII
and UV Light • Speed 30s per m for • No geometrical
visible light at 200 distortionQuantitative
ppcm colour analysis for
consistent core
description
• Area of measurement: • Measurements • Determination of clay,
presented against
c.10 mm2 / alteration, Fe-ore, and
depth in ASCII file /
• Speed: 10s per carbonate mineralogy /
measurement / • Data interpretation
ASD LabSpec performed by Geotek
VNIR/SWIR • Spectral Resolution /:
with purchase of
Spectrometer 3 nm @700 nm; 10 MinSpec software
nm @ 1400 nm/ 2100
nm
• Range /: 400 nm to
2600 nm
• Area of measurement: • Measurements • Fantastic borehole
presented against
c.10 mm2 / / correlation
depth in ASCII file
• Speed: 2s – 30s per • Sediment provenance
Point Magnetic tool due to stratigraphic
Susceptibility measurement /
constraints on
meter • Sensor sensitivity: 1 x deposition of magnetic
SI x10-6 / / minerals /
• Range: 26 SI
• Area of illumination: • Measurements • Quantitative colour
c.3 or 8 mm presented against analysis with Munsell
• Speed: 2s per depth in ASCII file colour code for
Colour measurement • Colour exported in consistent core
Spectrophotometer • Spectral range: following colour description
400 nm to 700 nm spaces: CIE, RGB, • Fantastic well to well
• Spectral resolution: XYZ and Munsell correlation tool
10 nm
• Elements reported • Spectra exported • Ultimate light energy
between Na and U as as ASCII files performance from
peak area [cps] • Element ppm dedicated ED-XRF
• Up to 24 elements concentrations and spectrometer
presented as ppm error reported • Determine Mg, Ca, Fe,
Geotek XRF
Spectrometer • Speed: 2s – 30s per against depth in Mn concentrations for
measurement ASCII file carbonate speciation
• Fully computer • Peak area cps • Determination of
controlled for highest reported from sediment provenance
precision and spectral analysis from elemental
repeatability software as ASCII distribution such as Ti-
flux
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
GEOTEK SENSOR PERFORMANCE DATA OUTPUT ADVANTAGE
TECHNOLOGY STATISTICS
• Helium-flushed • Development of
measurement cell for chemostratigraphic
ultra-sensitivity of light models for tectosilicate
energy elements such mineralogy
as: Na, Mg, Ai, Si • Improve well to well
• Full user control over correlation and regional
beam conditions, geological model
filters, and model through geochemistry
fitting
HIGH-RESOLUTION GEOSCAN VI LINESCAN CAMERA
Figure 4., Geoscan VI high-resolution linescan camera with VIS and UV lightbox
The Geoscan VI linescan camera operates by acquiring single lines of image data sequentially
down the core. Linescan images are far superior to area camera images because they do not
suffer from uneven lighting, spherical distortion, montage or “stitching” effects (Figure 4). The
camera captures images with a high dynamic range, allowing comparisons between light and
dark cores. In addition, they will achieve higher resolution (greater number of pixels per cm
(ppcm) for long thin objects like core samples.
The Geoscan VI camera has one massive c.5340 pixel CCD and is equipped with automatic
focus and aperture routines integrated into Geotek’s custom-designed user friendly software
for straightforward, simple and quick set-up. Furthermore, specular reflectance caused from
water/fluid-saturated cores is removed through cross-polarisation of the light source and the
lens; improving clarity and image detail (Figure 6).
Incoming light is passed through a set of red, green, and blue filters to produce true
independent colour separation. Averaged image data can be converted to these RGB values
and saved in a separate file to facilitate quantitative comparisons of colour between cores and
other downcore measurements (Figure 7). The camera is factory-calibrated and a standard
photographic 90% white, or 18% grey card is used for field calibration. Lighting and aperture
settings are software controlled ensuring that images can be qualitatively or quantitatively
compared to each other.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Even though the Geoscan VI is one camera it is capable of imaging cores at multiple
resolutions. This means that the core imaging system can be used for standard scanning for
data archival but also for high resolution scanning for potential image analysis routines or for
detailed microscope-level imaging over specific areas of the core. The following image
resolutions are available over the full width of a 4” core: 100, 200, 400, and 500 pixels per cm.
Images are output as 16-bit RGB TIFF images but are quickly and easily converted to JPEG
or other formats as required. RGB Colour Profile as ASCII.
Each Geotek core section image has a companion XML metadata file, containing important
metadata pertaining to the core section and imaging conditions. A ruler can be generated next
to the image, depicting either depth in core section or depth in core.
Figure 5., Example image of 4" core sample from Geoscan V at 200 pixels per cm in visible light
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Figure 6., Example core image at 500 pixels per cm. The left is of dry core surface; the right is of a fully
saturated wet core surface; note there is no bright spots of oversaturation from specular reflectance as
all specular reflectance from the fluid on the surface was removed using the Geotek cross-polarisation
technique
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Figure 7., Example of RGB profile extract from Geoscan V core image (e.g. Nederbragt et al., 2006)
Ultraviolet images are acquired in the same manner as visible. If the user wishes to
automatically collect a UV image after a visible image, both the visible and UV boxes should
be checked on the “Add Core Section” pane, in the MSCL software.
After the visible image is collected, the system will prepare to collect an ultraviolet image. On
the XYZ, the camera will move back to the top of the section, and the software will prompt the
user if the aperture requires changing. The software will also prompt the user to change the
aperture if necessary.
ASD LABSPEC CIS, VNIR/SWIR SPECTROMETER
Geotek has integrated ASD’s LabSpec 4 analyser onto the MSCL-XYZ_XRF platform. The
sample is illuminated by the integral halogen light source through a fibre optic link. The
spectrometer returns data from c.350-2500 nm which is collected and displayed in the MSCL
software alongside other geochemistry datasets acquired.
The ASD Labspec 4 visible, very near infrared (VNIR), and short wavelength infrared (SWIR)
spectrometer measures the vibrational bonds of molecules and their overtones, seen as
absorptions in reflected light (e.g. Hunt, 2014). The sensor is able to determine mineralogy
and colour information from the surface of the core. However, unlike the hyperspectral camera
this sensor using a point probe with a measurement area of approximately 10 mm2. The sensor
probe touches lightly onto the core surface and acquires the measurement at a discrete point.
As a result, the Labspec 4 sensor does not produce maps.
Spectra per measurement point is saved and displayed in the MSCL software in real-time.
Mineralogical interpretation are provided Geotek Minspec software and outputted against
depth. The format is ready for databasing and is compatible with a wide range of database
inputs. The spectra are stored in the cloud by project paths, with a user permission system for
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
users to access the data for their projects and for manager/supervisor level users to have
access to all company projects globally.
The mineral composition logs extracted from the core and displayed in the MSCL software
enable geoscientists to more confidently determine the interrelationship between mineralogy
and lithology through physical and chemical characteristics, thereby improving the lithological
description and stratigraphic correlation of geological formations.
Figure 8: Example output of ASD Labspec 4 infrared spectrometry data on left and XRF data on the
right. Displayed in Geotek MSCL Acquisition Software
POINT MAGNETIC SUSCEPTIBILITY
Alterations in the magnetic susceptibility within core samples are often stratigraphic.
Therefore, magnetic susceptibility records are an excellent well to well correlation tool. In
addition, the tool can be used to determine the lithological properties as well as any changes
in sediment provenance and/or diagenetic environment. An example of a magnetic
susceptibility dataset is presented in Figure 9. At about 10 ft into the example section an 8 ft
thick bed of raised magnetic susceptibility measurements are recorded indicating that the
composition of the core is more magnetic, this is normal for clay-rich or Fe-rich beds. This
interpretation is confirmed by the XRF data which shows elevated Al and Fe within this interval.
Although obvious from the data profiles it is not obvious from the visible images, highlighting
the value of continuous multi-sensor parameter profiles in understand core heterogeneity.
Magnetic susceptibility has also been shown to be useful in determining illite content (Potter
et al., 2004) or looking into the anisotropy of shale sequences (Ebufegha and Potter, 2014).
Geotek provide the Bartington MS2E point sensor with the MSCL-XYZ-XRF system as an
additional sensor option. This is electronically calibrated to measure a single standard of stable
iron oxide tested and analysed by Bartington. The data acquired using the MS2E sensor can
be presented as uncorrected mass specific magnetic susceptibility. The Bartington point
sensor (MS2E) is used for surface scanning and providing high-resolution surface
measurements on split sediment or slabbed rock cores.
Magnetic susceptibility data is collected through use of the MS2E probe and MS3 meter. The
data is displayed in the custom Geotek MSCL software and may be exported as ascii files for
further analysis and to created downcore profiles.
Alterations in the magnetic susceptibility within core samples are often stratigraphic. Therefore
magnetic susceptibility records are an excellent core to core correlation tool. In addition, the
tool can be used to determine the lithological properties as well as any changes in sediment
provenance and/or diagenetic environment. Magnetic susceptibility measurements can be
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
used as proxy for permeability measurements, and in the mining industry the susceptibility of
the core material can be used to determine the occurrence of volcanics and to feed into
magnetic anomaly models for geophysical surveys.
Figure 9., Figure 8: Example of core imagery, magnetic susceptibility, colour and XRF data presented
against depth, core colour (L*,a* and b*), and magnetic susceptibility. The core is from a conventional
North Sea Reservoir and is a section of the Brent Formation. Note the peaks in Zr, which are interpreted
as influxes of terrestrial sourced material into the basin
KONIKA MINOLTA COLOUR SPECTROPHOTOMETER
Defining the colour of a rock samples is probably the most subjective measurement of any
visual description because the perception of colour is dependent not only on how each of our
brains individually interprets incoming light but also on light levels, colour of the light, and even
the weather outside. As a result, one of the most fundamental descriptive tools of geology -
colour can often be one of the least reliable. Colour spectrophotometry is a spectroscopic
technique that measures reflectance between 360 nm and 740 nm at 10 nm intervals to
accurately define colour to remove subjectivity and improve consistency across visual
descriptions. Ultimately a colour spectrophotometer allows colour to become a powerful
lithology indicator and correlation tool (e.g. Rogerson et al., 2006) Figure 9).
Colour profiles can be exported directly from the Geoscan V images (e.g. Nederbragt et al.,
2006), however, if the user requires colour with different colour spaces or a quantified Munsell
colour code then Geotek recommend the Konica Minolta CM700d colour spectrophotometer.
A colour spectrophotometer is used to accurately define the spectral colour of the core. The
sensor head contacts the surface of the core which is normally covered a thin transparent
plastic film (‘clingfilm’, or similar products). This measurement enables accurate colour
analysis to be made at spatial intervals as low as 3mm (using a 3mm aperture compared with
the normal 8mm aperture). The data is used to report Munsell colours (if required) as well as
generating a simulated colour core for diagrammatic purposes where a detailed image is not
required or available.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
It is important to note that the ASD Labspec also presents colour data, therefore the Konica
Minolta is optional here.
5 GEOTEK XRF SENSOR TECHNOLOGY - MECHANICS AND SPECIFICATIONS
The ultra-sensitive Geotek XRF spectrometer is designed for class leading light energy
element (e.g Na, Mg, Al, Si) sensitivity to provide elemental distribution and abundances from
the surface of geological samples. It can be installed on a variety of Geotek MSCL systems
including the MSCL-XYZ.
Innovative close-coupled geometry with a market leading X-ray detector and signal processing
technology delivers impressive count rates at high spectral resolutions without the sacrifice of
measurement speed. Geotek XRF software features easy to use set-up windows giving the
user flexibility of measurement conditions and areas of illuminations; so whether focused on
palaeoclimate research, or oil and gas chemostratigraphy, the Geotek XRF should fit into your
workflow.
The Geotek XRF Sensor uses a 15W, 50kV sealed source, and as a result of its sealed and
low power nature, it is highly reliable (25,000 hours). This source life value is the number of
hours that the source can be utilised for, this number does not reflect time in which the source
is not being used.
The Geotek high-resolution, helium-flush XRF utilises a closed source. The benefit of utilising
this type of source mean that the system does not require any additional cooling to maintain
temperatures. This would mean less maintenance would be needed in comparison to an open
source system.
The design of the Geotek XRF sensor is focussed around shortening the source-object-
detector distance, and creating the right incident angle to collect as many fluorescence counts
as possible to offer the best sensitivity for low energy fluorescence X-rays (Na, Mg, Al, Si). To
further improve the sensitivity of light energy elements the Geotek XRF sensor utilises a closed
helium-flushed measurement cell, which is placed directly onto the sample surface. The
Helium reduces the absorption of the low energy fluorescence X-rays (in particular Na, Mg, Al
and Si) significantly improving sensitivity for these lighter elements. The limits of detections as
such, can be found in the Limits of Detection (LOD’s) document.
The Geotek XRF sensor uses the latest SDD detector technology with cube-preamplification
for improved count rate. The detector has a collimated area of 30 mm2, which is one of the
largest detectors for high resolution scanning on the market. The Geotek XRF sensor,
therefore, boasts an impressive performance at low peaking times, resulting in high output
count rates (c.200,000 ocr) with excellent resolution c.133eV. The >15,000 peak
to background ratio combined with the high resolution and short source-object-detector
distance design results in excellent sensitivity for light elements. In addition, this detector
technology enables the analysis of the Sodium (Na).
The XRF sensor uses a series of filters of different z-values and thickness, whilst operating
the source at different kV settings to gain the full spectrum of elements. The system therefore
has a ‘standard' two beam mode, whereby the same measurement point is measured
twice. The standard beam modes use 10kV with no filter for the lower energy elements, and
40kV with 125 micron of silver filter for the higher energy elements. Geotek proprietary
software and a set of calibration pieces are then fed into a fundamental parameters algorithm
to produce quantification of elements from the core surface.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
The collimator enables the cross-core irradiated sample area. It can be set to 15, 10, and 5
mm and must be manually changed. Filters can be changed by moving the motorised
filter/shutter assembly.
Helium flushing: Air along the X-ray path will absorb a part of the X-ray fluorescence,
particularly that of light elements. Moreover, air above the sample will provide an argon peak
in the spectrum. With He-flushing the air above the sample will be removed thus the Ar peak
will disappear from the spectra. Moreover, peak intensities of light elements, such as Mg, Al,
and Si, will considerably increase because He gas absorbs very little of the x-ray fluorescence.
The two windows of the measuring cell are covered with 4μm thick film. These films can be
easily replaced if they become punctured by the core surface. The irradiated downcore sample
area can be varied with the motorised variable slit between 10 and 0.1mm.
The Geotek XRF sensor delivers superb light energy element performance at resolutions down
to 0.1 mm making the sensor perfect for detailed studies on highly laminated sediments. The
latest advances in X-ray detector technology and digital signal processing coupled with an
improved helium flushed cell and new filter wheel mechanism produce higher spectral
resolution without the sacrifice of measurement time.
• The ultra-sensitive Geotek X-ray fluorescence (XRF) spectrometer acquires
precise elemental abundances from the surface of sediment and rock cores, and
offers superior sensitivity for light elements.
• High performance large area silicon drift detector (SDD) with a helium-flushed
measurement cell dramatically improves sensitivity, especially for the light
elements such as Na, Mg, Al, and Si
• Widest range of elements from Na to U at ppm levels
• Motorised X-ray slits enable a downcore spatial resolution of 100 μm or less
• Sophisticated filter slide to lower detection limits across a wide range of elements,
and allows different cross-core areas to be illuminated – perfect for high-resolution
studies of dipping laminae
• Low-power sealed X-ray source for long life (>25,000 hours) with no maintenance
• A unique close-coupled geometry for high efficiency at low X-ray tube power
• Simple to use custom-designed software automatically communicates with the
logger to acquire, interpret, and display the fluorescence spectra with element
abundance during acquisition
• Precise measurements are assured through a combination of peak fit and
deconvolution algorithms using a proprietary quantitative analysis suite
The Geotek XRF head can operate in two distinct approaches – calibrated and uncalibrated,
the differences as follows:
• The calibrated mode uses a tuned fundamental parameters technique to convert
elemental peaks in the collected spectra to semi-quantitative concentrations in parts-
per-million (ppm) for the possible 22 elements.
• The uncalibrated mode simply collects the raw XRF spectra for given beam conditions
that the user can specify depending on which elements they are interested in – certain
beam conditions are optimised (excitation and filtering) for certain ranges of elements.
Using bAxil software the spectra can be analysed to determine the intensity (counts or
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
counts/s) of individual element peaks (many more than the possible 22 elements in the
calibrated mode). This is a technique commonly used in academia for looking at
changes in the rock and sediment chemistry, specifically using elemental ratios (eg
Fe/Ti, Sr/Ca).
5.1 DEMONSTRATION OF GEOTEK XRF PERFORMANCE
A Pre-Cambrian Tuff hand specimen sample was provided to Geotek for XRF analysis,
photography and X-ray imaging. Whilst a range of properties can be acquired from this
geological sample this document will focus on the XRF data as requested. The data were
acquired on a Geotek MSCL-XYZ XRF. However, it should be noted that the same dataset
can be acquired on the Geotek MSCL-XYZ XRF offering the same excellent performance,
analytic resolution, and repeatability of measurements. The sample was kindly donated by the
National Geological Repository, British Geological Survey.
5.2 XRF RESULTS FROM THE TUFF SAMPLE
A visible image of the sample was collected at 25 µm per pixel resolution with the sample
surface wetted and with a cross-polarisation technique applied to the light source and lens
used to reduce specular reflection. This results in a spectacular image as illustrated in Figure
10. Although, note the resolution of the image has been reduced for the purposes of this report.
The profiles of XRF data were acquired using the Geotek XRF system at downcore resolutions
of 10 mm (blue curve in Figure 10) and 0.1 mm (red curve in Figure 10) along the full length
of the sample both with a step size of 0.1 mm. An example of this data (Ca profile in ppm) is
presented alongside the image, its position indicated by a white line (Figure 10, left image).
The 0.1 mm profile clearly demonstrates the resolution capabilities of the Geotek XRF and
picks out features and laminations that are clear from the image. A comparison between the
0.1 mm and 10 mm profiles shows excellent correlation with respect to measured ppm values
highlighting the excellent repeatability of the Geotek XRF sensor and MSCL systems. The 0.1
mm step size profiles took 14.5 hours to acquire and 10 mm step size profile (although not
presented) took 9 minutes to acquire.
A 2D XRF mapping program was also run over a small area of the sample (2.1 cm cross core
and 6 cm down core) at a bin size of 0.1 mm x 1 mm (downcore x cross core). An example
map (Ca, %) is also presented alongside the image, its position indicated by the white
rectangle. As with the profile the high-resolution mode demonstrates its value in picking out
fine scale features both down core and cross core.
All downcore profile XRF measurements were made under a helium atmosphere using a cross
core aperture of 15 mm. This represents an illumination area of 15 x 10 mm and 15 x 0.1 mm
for the measurements described above.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
10mm and 0.1 mm
20 µm Downcore Resolution
6 x 2 cm
Image Profiles (Ca ppm)
Map (Ca % )
Note:
The white box indicates the ar ea of the surface map.
The white line indicates the position of the downcor e
profiles.
Figure 10., Summary of Results for Tuff sample
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
5.3 LOW ATOMIC NUMBER (Z) SENSITIVITY
The Geotek system is capable of detecting Na in percentage levels. Two examples of spectra
demonstrating this are shown below. The upper of the two shows a definite peak area for Na
at a level of approximately 1% (Figure 11), the lower of the two spectra represents a Na
concentration at approximately 0.5 % (Figure 12).
Note also in the upper spectrum the Mg peak, representing a concentration of approximately
0.0014 %. These two spectra also show excellent signal to noise characteristics (Note:
measurements made using a live time of 30 seconds and an illumination area of 15 x 10 mm)
Figure 11., Example XRF spectra showing detection of low atomic number (z) elements. The green area
is the brehmsstrahlung, light red is the escape peaks and the dark red are the sum peaks. Yellow is the
peak area and what is used for calculation of peak areas counts per second and concentration.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Figure 12., Example XRF spectra showing detection of low atomic number (z) elements. The green area
is the brehmsstrahlung, light red is the escape peaks and the dark red are the sum peaks. Yellow is the
peak area and what is used for calculation of peak areas counts per second and concentration.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
5.4 REPEATABILITY OF MEASUREMENTS ON A GEOTEK XRF SENSOR
Repeat runs at different measurement times were run to show the repeatability of the system
and the noise levels to be expected at different timings; 6 seconds, 3 seconds and 1 second
live times. The plot below (Figure 13) demonstrates the system repeatability run to run and the
noise level increase with reduced measurement times. All measurements made with an
illumination area of 15 x 10 mm.
30000
25000
20000
Ca (ppm)
15000 6 secs
3 secs
1 secs
10000
5000
0
0 20 40 60 80 100 120 140 160 180
Depth (mm)
Figure 13., Repeat XRF profile at the same core positions with different measurement times to show
repeatability of measurements.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
5.5 CALIBRATED GEOTEK XRF DATA VS. LABORATORY XRF DATA
Data collected from a prepared shale sample (fused beads and pressed pellets) from an
accredited laboratory have been compared with data from the Geotek XRF measured directly
on the split core surface, these data are shown below (Table 4) and demonstrate an excellent
correlation especially when considered the reported porosity of the shale (between 1 and 5%).
The measurement of the shale using the Geotek XRF was made using an illumination area of
15 x 10 mm and a live time of 30 seconds.
Whilst it would be possible to run the same experiment using a standard rock piece Geotek
have opted for using a typical shale sample which is more typical of the types of clay-rich
material. This test gives a better representation of how accurate the Geotek XRF sensor will
be for normal logging practises.
Table 4., Comparison of conventional XRF measurements on a fused bead and pellet sample and
Geotek XRF sensor on a bare rock surface
ELEMENT
LAB ANALYSIS* GEOTEK XRF ANALYSIS**
ANALYSED
Data Presented at %
Mg 1.21 1.01
Al 9.99 9.79
Si 28.86 28.28
P 0.06 0.03
S 0.10 0.00
K 2.86 2.80
Ca 0.33 0.20
Ti 0.59 0.29
Mn 0.08 0.11
Fe 5.00 4.90
Ba 0.05 0.08
Data Presented as ppm
V 7.5 37
Cr 1 60
Ni 3.5 9
Cu 3 3
Zn 10.5 14
As 1 0
Sr 52 0
Zr 1 0
Notes:
* Measurements acquired from specially prepared fused beads and pressed pellets
** Measurements acquired from slabbed core surface with no preparation, a 15 mm x 10 mm area of illumination with a 30 second count time
(dwell time)
Analysis was performed on a Delabole Slate sample with a porosity of 1-5%
GEOTEK XRF SENSOR CONCLUSIONS
The high resolution XRF profiling (0.1 mm downcore resolution) of the tuff sample from Section
5.2 demonstrates the capability of the Geotek XRF to pick out very fine scale features without
the blooming effect typically seen in system where the sample is not shielded.
The Geotek XRF systems design of the close coupled geometry of the source and detector to
the sample acts to significantly increase the signal to noise ratio of the data whilst keeping the
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
source power low. The overlay of the lower resolution profile (10 mm) indicates the
repeatability of the measurements using different geometries and highlights that multi-
resolution studies can be carried out on core samples with confidence.
The 2D map of the part of the tuff surface (Figure 10) demonstrates the capability of the Geotek
XRF to collect extremely high resolution data, accurately located in relation to other data, over
a relatively large area and shows how well the mapping feature can pick out fine scale features
in both cross and downcore axes.
The low Z (atomic number) sensitivity of the Geotek XRF is demonstrated in the example
spectra presented and the positive identification of Sodium (Na) in a core scanning XRF is
unprecedented.
The repeatability of the system and the signal to noise levels are shown to change is differing
times of measurement – repeatability is excellent and as expected noise levels increase with
decreasing measurement times.
The calibrated data from the Geotek XRF data show excellent agreement with laboratory XRF
data despite the known difficulties of inter-calibration between laboratory and core scanning
XRF systems – these include, grain size, surface roughness, matrix and porosity effects.
5.6 GEOTEK SOFTWARE PRODUCTS
Geotek deliver our MSCL-XYZ-XRF with custom geoscience-focussed software packages that
allow the user to export data along with its metadata. This metadata includes: core name,
section number, core depth, sample length, and acquisition parameters, including beam
conditions, live/dead time, and measurement times.
The system is equipped with a custom Geotek acquisition software package and specialised
XRF processing software for determining elemental concentrations. This XRF processing
software employs a proprietary fundamental parameter approach and provides concentration
data for 22 key elements. These 22 key elements are used as a Geotek standard for calibration
purposes, but further elemental identification is possible at a client by client basis. Additionally,
Geotek provide bAxil spectral analysis software, which determines the peak area (counts) for
individual elements that can then be used for elemental ratioing.
The Geotek acquisition software package displays raw and processed datasets from XRF and
other contact sensors immediately following sensor measurement. This allows for real-time
analysis and decision making to occur for various geological projects in the field or lab space.
GEOTEK ACQUISITION SOFTWARE
Starting any new core logging project requires the user operator to open the MSCL-XYZ
Acquisition software so they may log a new core. This displays the New Section panel, in
which a user can input the correct core identification (name, section number, depth, length)
and select the acquisition settings desired such as the sampling interval and the measurement
times for certain sensors such as XRF (Figure 14).
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Figure 14., MSCL-XYZ-XRF Set-up window display
Prior to logging the Geotek XRF sensor must be setup using the XRF Controller window in the
MSCL-XYZ Acquisition software. While automated logging is taking place the sensor
parameters and the spectra being collected can be viewed in the XRF Controller window but
not changed or interrogated. Data is plotted in the MSCL Spectral Data Display along with
data from the magnetic susceptibility sensor and colour spectrophotometer, if installed.
However, the XRF Controller can also be controlled separately using a piece of additional
software called Geotek Utilities. This is designed for testing purposes to determine the
optimum mode and measurement times for the particular material being measured, or for
collecting spectra from discrete samples. (Figure 15). Data for each measurement point is
continuously displayed in the XRF Controller Pane as it is acquired, including the raw XRF
spectrum. This window can also be viewed during automated logging from the XRF menu in
the ‘MSCL Data Display.’
During the logging of cores, the software automatically controls the XRF sensor. The interface
to the device through this Main tab allows the user to:
• Select the mode to use (measurement atmosphere + cross-core aperture x slit
width)
• Define the time of measurement per beam
• Switch on and off the x-ray source
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
• Start and stop measurements
• See the spectrum being acquired and the conditions used to collect it (x-ray tube
voltage and current)
• See the current time of measurement (live, real and dead time)
Figure 15., Geotek XRF controller interface window
From this XRF Control window the user can modify or create individual modes to suit their
needs using the Mode Browser. Adjustable features of the XRF modes include the beam
conditions (kV, µA), the area of illumination, the number of beams within a mode and the beam
filter material (Al, Ag, Cu).
The advanced tab in the XRF Controller shows more details of the system including the X-ray
tube voltage (kV), current (µA), and temperature, the temperature of the high voltage power
supply, the downcore slit width and cross core aperture width, and the filter in front of the
source (Figure 16).
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Figure 16., Geotek Modes Browser where individual modes can be edited or created.
Figure 17., Advanced Panel where the XRF head hardware status can be viewed.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
During logging core, data is displayed as elemental abundances in ppm (parts per million).
The elemental abundances come directly from the Geotek XRF sensor head, which feeds into
the acquisition software, which displays the spectra and elemental data (Figure 9). For each
XRF measurement point, the spectrum is displayed. The spectral window supports zooming
for detailed inspection and further analysis whilst logging. Elements can be plotted on a single
graph, or can be plotted in individual graphs (Figure 18)
Figure 18., MSCL Spectral Data Display showing, from the left, XRF spectra, XRF element data in %,
laser profile of the core height, magnetic susceptibility, and total XRF counts.
BAXIL SOFTWARE
Geotek provide the bAxil spectral analysis software to analyse the elemental data. The bAxil
software processes the spectra using a basic template that defines each element and from
that may calculate the peak area for the user.
The bAxil application software, offered with the MSCL-XYZ-XRF, is a software developed for
the analysis of energy-distributed X-ray spectra. The software also performs quantitative
analysis using different methods. bAxil spectrum analysis algorithms are based on the well-
known AXIL spectrum analysis methods. This new implementation summarizes the working
experience and feedback over more than 30 years from a large AXIL user’s community. bAxil
algorithms and graphical user interface sum up the coding experiences over all these years
while, at the same time, incorporates new and powerful programming techniques.
The bAxil’s spectrum analysis engine is based on the internationally well-known AXIL
(Analysis of X-ray spectra by Iterative Least Squares) fitting routines. However, these
algorithms have been considerably updated and expanded with the implementation of new
concepts and recent developments in the spectrum analysis and peak deconvolution.
The new bAxil calculation and analysis engines take also into account the most recent
developments in XRF excitation, detection and electronics technology that has changed the
actual ED XRF measurement technique. Updates also allowed the bAxil software to be
compatible with Windows PC’s and Mac iOS.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Figure 19., bAxil software display showing different elemental abundances at this particular depth. Y-
axis is presented in a log scale. Dark red area is the original spectral data, and peaks represent the
number of counts of photons with particular energies
Figure 19 displays an XRF spectrum where peaks represent the number of counts of photons
with particular energies. Each of these energies are characteristic for a particular element. The
bAxil software calculates the ‘area’ under the curves of a wide range elements, allowing the
user to see relative intensities and to derive element ratios. This can be seen modelled in
yellow. The software also equates for any background noise (green) due to the source and
detector, as well as ‘sum’ and ‘escape’ peaks (red and purple).
The processing of spectra is defined by a template that is unique to a particular beam condition
and defines the elements of interest (Beam 1: 10 kV, Beam 2: 40 kV). Figure 19 displays a
single spectra, but bAxil is accompanied by another piece of software, ‘bAxil Batch,’ which
can process multiple spectra using a template (Figure 20) and export the data into a
convenient CSV file. This is convenient for analysing large numbers of spectra acquired from
high-resolution logging of cores.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Figure 20., Template of multi-spectra elemental dataset in bAxil Batch software.
6 GEOTEK SUPPORT AND WARRANTY
With more than 260 systems sold world-wide, Geotek have developed a global distributor
network allowing for multi-sensor core logging systems to be produced for purchase, lease or
service work at all corners of the globe. Furthermore, Geotek have a select team of
experienced geologists and engineers who install and give advanced training on such
technical equipment, ensuring the user is capable and set for efficient logging techniques. This
experienced team are available for remote and on-site support for our global customer base.
Geotek design and manufacture the MSCL systems in our warehouse facility in the UK,
ensuring the equipment to be sturdy, rugged and flexible for offshore and onshore use, in the
lab or in the field. The modular design of the systems allows for customisation and user input
when manufacturing, as this may be done on a client to client basis. This also allows for user
upgrades, as sensors may be added at a later date dependant on client budget and time-
frames. Due to the rugged nature of the equipment, the MSCL systems may last decades, with
recommended software and PC upgrades on occasion.
Geotek offer a 12 month warranty with all new equipment purchased. After the warranty period
Geotek offer multiple levels of cover for support in the form of Gold and Silver service
contracts.
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
6.1 ANNUAL GOLD SERVICE CONTRACT
GOLD contracts include parts and labour, with one site call out per year. In the likely event
that no specific "call out" is required due to malfunction or failure then the visit will be made to
perform a preventative maintenance/calibration/training visit with up to 3 days onsite
(depending on specific instruments in cover).
GOLD cover also provides annual entitlement to telephone and on line support with "team
viewer" online diagnostics where available. Geotek recommends at least a 3 year coverage to
allow for an annual check-up and full support throughout the year, rather than multiple service
visits (circa EUR 1800/day). Through commitment to a 3+ year contract, customers are offered
a 5% discount.
6.2 ANNUAL SILVER SERVICE CONTRACT
SILVER contracts include annual entitlement to telephone and on line support with "team
viewer" with diagnostics where available. It does not include labour and consumable parts and
an annual service and training visit for the MSCL instruments. The silver option does not
include any service support visits that may incur. There is, however, a 30% discount on service
visits (parts and labour but not including expenses) for silver service contracts. Through
commitment to a 3+ year contract, customers are offered a 5% discount.
7 MSCL-XYZ-XRF CUSTOMER REFERENCES
Relevant research customers of MSCL-XYZ systems include:
• British Geological Survey
• Turkish Geological Survey (MTA)
• National Oceanography Centre (e.g. Rothwell and Rack, 2006)
• International Ocean Drilling Program
• Oil and Gas service lab company in Houston
• JAMSTEC onboard the D/V Chikyu
Geotek MSCL – XYZ – XRF system Geotek Ltd – www.geotek.co.uk
Keskkonnaamet
Kiirguskaitse büroo
Kliima ja kiirgusosakond Teie: 18.08.2022
[email protected]
[email protected] Meie: 19.09.2022 nr 9-3/22-262
XRF seadme registreerimine
Austatud Richard Lõhkivi
Olete edastanud meile KOTKASE infosüsteemis 18.08 teavituse, et XRF seadme kasutamiseks
on vajalik esitada kiirgustegevusloa 18/035 muutmise taotlus või uue kiirgustegevuse loa
taotlus.
Plaanime esitada uue kiirgustegevusloa taotluse, et registreerida olemasolev elektrooniline
kiirgusseade (käsi-XRF). Selle kuu alguses hankis EGT lisaks olemasolevale käsi XRF-ile,
veel ühe XRF seadme (puursüdamiku skänner). Nimetatud seadme paigaldamine ning
tootjapoolne koolitus toimub eeldatavalt oktoobrikuu jooksul ja ilmselt peame registreerima ka
selle seadme kiirgustegevusloas. Lisame juurde hangitud seadme tehnilise juhendi, kus tabelis
2 on esitatud kiirgusseadme näitajad. Soovime, et mõlemad XRF seadmed oleksid kantud ühele
kiirgustegevusloale.
Kuna uus seade pole veel installeeritud ning tootja poolt üle antud ja võttes arvesse uue
seadmega töötamiseks vajalikku koolitusele ning nõutud eeskirjade ja juhendite
väljatöötamisele kuluvat aega, palume pikendada uue kiirgustegevusloa taotluse esitamise
tähtaega kuni 31.12.2022.
Lugupidamisega
(allkirjastatud digitaalselt)
Sirli Sipp Kulli
Direktor
Fr. R. Kreutzwaldi 5 / 44314 Rakvere /
[email protected] / www.egt.ee
Registrikood 77000387